The RSD diffractometer features a vertical goniometer design with an optimized mechanical structure, delivering high angular accuracy. It is equipped with an automated sample loading/unloading system, ensuring convenient operation and straightforward maintenance. The X-ray tube, solid-state high-voltage power supply, and cooling system are all independently developed and manufactured, guaranteeing the instrument’s reliability and durability. The accompanying analysis software is highly powerful, supporting multi-format data output and compatibility with mainstream third-party applications, offering flexible usability. Optional accessories include high/low temperature stages, thin‑film setups, in‑situ measurement modules, small‑angle scattering systems, and more, making the instrument suitable for a wide range of applications such as materials research and industrial inspection. With its stable performance and versatile configuration, the RSD diffractometer empowers your scientific research and analytical workflows.

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Product Introduction
Technical Specifications

- Commodity name: X-ray Diffractometer
- Commodity ID: RSD
- 设备类型: Diffractometer
- 标签蓝: High-precision angle measurement
- 标签绿: Self-developed with high reliability
- 标签橙: Strong software compatibility
- 标签红: Multi-domain adaptable
- 检测类型: Phase, stress, and structural analysis
- 检测方式: Vertical protractor
- 设备类型: Large-scale precision analytical instruments
- 特点: Standard Equipment | Crystal Structure Analysis | Offline Inspection
The RSD diffractometer features a vertical goniometer design with an optimized mechanical structure, delivering high angular accuracy. It is equipped with an automated sample loading/unloading system, ensuring convenient operation and straightforward maintenance. The X-ray tube, solid-state high-voltage power supply, and cooling system are all independently developed and manufactured, guaranteeing the instrument’s reliability and durability. The accompanying analysis software is highly powerful, supporting multi-format data output and compatibility with mainstream third-party applications, offering flexible usability. Optional accessories include high/low temperature stages, thin‑film setups, in‑situ measurement modules, small‑angle scattering systems, and more, making the instrument suitable for a wide range of applications such as materials research and industrial inspection. With its stable performance and versatile configuration, the RSD diffractometer empowers your scientific research and analytical workflows.

Core Features and Advantages of the Product

Features: The RSD‑type X‑ray diffractometer is equipped with a fully self‑developed suite of core components and a high‑precision vertical goniometer system, enabling versatile analysis of bulk materials, thin films, and other sample types. It delivers accurate diffraction data, unlocking the mysteries of material microstructures. Backed by robust in‑house technologies and flexible configuration options, it comprehensively addresses the diverse needs of materials research and industrial inspection, providing stable, efficient, and precise analytical support for cutting‑edge scientific investigations and industrial innovation.

Advantages:

Precision mechanical structure, with detection accuracy maximized.

The system employs an optimized, upgraded vertical goniometer design, with a mechanically engineered structure that has been specially tailored and calibrated to deliver exceptional angular measurement accuracy. It comes standard with an automated loading/unloading mechanism, streamlining manual operations and simplifying routine maintenance, thereby balancing high‑precision measurement with user‑friendly operation.

All components are independently developed, ensuring long-term stability and reliability of the entire system.

The X-ray tube, solid-state high-voltage power supply, and cooling system—along with all other core components—are independently developed and manufactured in-house, ensuring superior software–hardware integration. This approach eliminates compatibility issues associated with externally sourced parts, resulting in enhanced operational stability, extended service life, and reduced costs for future downtime and maintenance.

All‑in‑one, in‑house‑developed software ensures seamless data interoperability.

Comes with proprietary, in-house‑developed analysis software offering comprehensive data‑analysis capabilities; supports multi‑format data export, seamlessly compatible with all mainstream third‑party analysis tools on the market, and adaptable to diverse researchers and a wide range of optional accessories, ensuring suitability across all application scenarios.
It can be paired with a range of specialized optional accessories—such as high/low temperature, thin-film, in-situ, and small-angle scattering modules—allowing for flexible configuration to create customized testing setups. One instrument meets diverse analytical needs, including fundamental materials research, in-situ testing under special conditions, and industrial‑scale quality inspection.

Modular, all‑purpose expandability with a wide range of industry‑specific accessories.

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Polar diagram attachment Fiber attachment

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High-Temperature Accessory Six-position rotating sample stage

Project	Description
Scanning System	Scanning radius: desktop model 150 mm; table‑top model adjustable between 180 and 300 mm.
	Angular repeatability: 0.0005°
	Full-spectrum deviation: ±0.02°
X-ray tube	Target materials: Cu / Co / Fe / Mo / W / Cr, optional
	Spot size: 1×10 mm, 0.4×14 mm (customizable)
	Power: 600 W / 3000 W
High-voltage power supply	Voltage: 60 kV (0.5 kV step)
	Current: 50 mA (0.5 mA per step)
	Cooling method: Air cooling in a solid-state package
probe	Counting rate: 10⁵ ~ 10⁷ cps (depending on the type)
probe	Energy resolution: ≤50% (scintillator) to 300 eV (SDD)
Operation and Display	Degrees-minutes-seconds display or degrees display;
	Manually set the standard angle;
	Real-time display of the deviation angle between the crystal under test and the standard angle.
Environmental Requirements	Temperature: 20°C ± 5°C
	Humidity: 50% ± 15%
	Power Supply: AC 220 V, with 8 kW capacity reserved.
Product Applications	It is suitable for a wide range of applications, including materials research and industrial inspection. The RSD diffractometer, with its stable performance and flexible configuration, supports your scientific research and testing endeavors.

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RAYSOV Instrument Co., Ltd.

Address: No. 57, Longteng Avenue, Zhen’an District, Dandong City, Liaoning Province, China

Email:info@raysov.com

Phone:86-415-6277666

Fax: 0415-6277566

Website Development: China Enterprise Dynamics Shenyang

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X-ray Diffractometer

Core Features and Advantages of the Product

Precision mechanical structure, with detection accuracy maximized.

All components are independently developed, ensuring long-term stability and reliability of the entire system.

All‑in‑one, in‑house‑developed software ensures seamless data interoperability.

Modular, all‑purpose expandability with a wide range of industry‑specific accessories.

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1	2

Polar diagram attachment	Fiber attachment

3	4

High-Temperature Accessory	Six-position rotating sample stage